initial check in based on SVN revision 575

source/adc.h

@@ -0,0 +1,141 @@
+/*
+ * adc.h
+ *
+ *  Created on: Mar 31, 2023
+ *      Author: Keith.Lloyd
+ */
+
+#ifndef ADC_H_
+#define ADC_H_
+
+
+#include "arm_math.h"
+
+#define ADC_NUM_AVERAGES		10		//number of samples averaged for measurements
+
+#define ADC_VREF				3.3 //3.23	//ADC reference voltage = 3v3 supply (Measured @ 3.23v)
+#define ADC_HALF_COUNTS			2048	//half of max ADC reading
+#define ADC_OFFSET_MAX_ERROR	30		//maximum allowed error for ADC offset measurement
+
+
+
+
+#define ADC_USE_NOISE_OFFSET	1		//Use a standard noise offset
+#define ADC_NOISE_OFFSET_COUNTS	13		//ADC offset due to precision rectifier noise conversion to DC
+
+#define ADC_CORRECT_FOR_CURRENT_NOISE	1	//Correct current measurement for noise from the precision rectifier
+
+
+#define ADC_USE_CURRENT_TABLE	1		//Use the current table to scale current measurements
+#define ADC_TABLE_COLUMNS		2		//number of columns for current and voltage tables
+#define ADC_TABLE_COLUMNS2		3		//number of columns for current and voltage tables with offset
+#define ADC_TABLE_FREQ			0		//frequency column in current and voltage tables
+#define ADC_TABLE_SCALE			1		//scale column in current and voltage tables
+#define ADC_TABLE_OFFSET		2		//offset column in current tables
+
+
+#define ADC_LOW_GAIN_CURR_CLIP_THRESH	1050	//LOW gain current measurement clipping threshold (in ADC counts)
+#define ADC_HIGH_GAIN_CURR_CLIP_THRESH	800		//HIGH gain current measurement clipping threshold (in ADC counts)
+
+#define ADC_LOW_GAIN_VOLT_CLIP_THRESH	1050
+#define ADC_HIGH_GAIN_VOLT_CLIP_THRESH	800
+
+#define ADC_MEASUREMENT_TEST	0		//Collect ADC data @ adc sampleRate when triggered. FOR TESTING
+
+#if ADC_MEASUREMENT_TEST
+#define ADC_NUM_TEST			40		//10mS samples
+#endif
+
+typedef struct {
+	bool	measure;			//measure ADC values in timer ISR
+	//current measurement offset
+	bool iosOK;					//current offset within limits, use it
+	uint32_t I_OffsetAdc;		//Current channel offset - measured @ startup
+	uint32_t rawCurrent;		//raw current measurement used for offset
+
+	//Voltage measurement offset
+	bool vosOK;					//voltage offset error within limits, use it
+	uint32_t V_OffsetAdc;		//VOltage channel offset - measured @ startup
+	uint32_t rawVoltage;		//raw voltage measurement used for offset
+
+	bool currentClipping; 		//Current measurement clip status (for LOW and HIGH gains)
+	bool voltageClipping;		//Voltage measurement clip status (for LOW and HIGH gains)
+
+
+	//storage for raw ADC values (0 - 4096). Sum up samples
+	uint32_t V_ID1_RAW;		//ch5 Port A identifier.
+	uint32_t V_ID2_RAW;		//ch6 Port B identifier
+	uint32_t V_CHK_RAW;		//ch7 Incoming voltage eg. 110V
+	uint32_t V_PSU_RAW;		//ch3 Power supply monitor
+	uint32_t V_TMP_RAW;		//ch8 External temperature
+	uint32_t I_OUT_RAW;		// ch0 Current out
+	uint32_t V_OUT_RAW;		// ch1 Volts Out
+	uint32_t V_BAT_RAW;		//ch4 Battery Voltage
+	uint32_t V_BID_RAW;		//ch10 Battery ID
+
+	//Storage for scaled value - float32_t
+	float32_t V_ID1;
+	float32_t V_ID2;
+	float32_t V_CHK;
+	float32_t V_BID;
+	float32_t V_BAT;
+	float32_t I_OUT;
+	float32_t V_OUT;
+	float32_t V_TMP;
+	float32_t V_PSU;
+
+	//Storage for filtered values - float32_t
+	float32_t I_OUT_SlowFilt;
+	float32_t V_OUT_SlowFilt;
+	float32_t V_OUT_FastFilt;
+	float32_t I_OUT_FastFilt;
+	float32_t Ohms_slowfilt;
+
+
+	// Delay Lines for filters
+	float32_t V_OUT_Delay;
+	float32_t I_OUT_Delay;
+	float32_t V_OUT_FastDelay;
+	float32_t I_OUT_FastDelay;
+	float32_t Ohms_FastDelay;
+	float32_t Ohms_SlowDelay;
+
+#if 1	//ADC raw current filtering - This is for testing
+	float32_t IRaw;
+	float32_t IRawFilt;
+	float32_t IRawDelay;
+#endif
+
+#if 1	//ADC raw voltage filtering - This is for testing
+	float32_t VRaw;
+	float32_t VRawFilt;
+	float32_t VRawDelay;
+#endif
+	uint32_t diag_bat; // commented test value for battery diagnosis
+	//TESTING - faster current measurement without averaging
+#if ADC_MEASUREMENT_TEST
+	bool		testCollectData;
+	uint32_t 	testIndex;
+	//storage for sampled data
+	float32_t testData1[ADC_NUM_TEST];
+	float32_t testData2[ADC_NUM_TEST];
+
+
+	float32_t testIout;
+	float32_t testIoutDelay;
+
+	float32_t testVout;
+	float32_t testVoutDelay;
+
+#endif
+
+}ADC_t;
+
+
+void ADC_Init2(void);
+void ADC_MeasureCurrentOffset(void);
+void ADC_Update(void);
+float32_t FILT_ExpAvgF32(float32_t input, float32_t *temp, float32_t k);
+
+
+#endif /* ADC_H_ */